The STS measurement system is used to test power semiconductors and power semiconductor modules.

There are 70 freely usable power and sense connections abailable, which enable software-controlled...

The TLW 800 test system is used to observe the behavior of IGBT modules, diodes, and MOSFET modules for variable loads and the junction temperature of the components in a long-term test.

In this...

The TLW 763 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TSM 738 enables the measurement of the common characteristics of power semiconductors with only one DUT contacting.

The system consists of maximum six components and can be varied depending on...

• Testing of power semiconductors and power semiconductor modules
• All application areas of the individual devices
• Reverse current measurement
• Forward current measurement
• Leakage current...

The Gate stress generator GSG 664 is used to stress power semiconductors, especially IGBTs, by a selection pulse.

Therefore the Gate of the DUT is loaded by voltage pulses. The test voltage is...

The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.

The test system consists of up to 6 components and is fully variable...

The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.

It offers all static parameter tests in one instrument. For application in a pick...

The measuring device for leakage currents LCM 625 is used for measuring the gate leakage currents of MOS-transistors and IGBTs during production (series measurement).

Due to accelerate the...

The test system TPS 625 or 746 is used to test power semiconductors.

The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...