The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 800 test system is used to observe the behavior of IGBT modules, diodes, and MOSFET modules for variable loads and the junction temperature of the components in a long-term test.

In this...

The TLW 763 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 739 has been designed to verify the life cycle characteristics of up to 18 power semiconductor devices (IGBT, MOSFET, Thyristor and diode).

Testing is implemented with forward load current...