STS 805 - Static Test System
The STS measurement system is used to test power semiconductors and power semiconductor modules.
There are 70 freely usable power and sense connections abailable, which enable software-controlled...
Sperrspannung
JT 777 - JEDEC Tester
The JT 777 is used to test diodes according to JEDEC Standard No. 282B.01. This describes the stress on diodes caused by alternating forward and reverse operation in the limit area of the...
DTS 761 - Dynamik Test System
The DTS 761 is used to determine the dynamic characteristics of power semiconductors during switching operation.
The DTS 761 is able to test single modules (1 DUT + 1 reverse diode), half bridges,...
TPS 746 - Testsystem für statische Messungen an Leistungshalbleitermodulen
The test system TPS 625 or 746 is used to test power semiconductors.
The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...
TSM 738 - Statik Test System
The TSM 738 enables the measurement of the common characteristics of power semiconductors with only one DUT contacting.
The system consists of maximum six components and can be varied depending on...
BVM 738 - Sperrmessgerät für Leistungshalbleiter
The measurement instrument BVM 738 to investigate into the blocking characteristics of power semiconductors.
The device is designed for manual use as well as for integration in an automated...
BVM 729 - Kennlinienmessgerät
The measurement instrument BVM 729 is used to investigate the blocking characteristics of power semiconductors. Peak voltages of up to 3,000 V are available at currents of up to 60 mA.
The BVM 729...
SML 726 - Sperrspannungsmessgerät
The measurement instrument SML 726 to investigate into the blocking characteristics of power semiconductors. A peak voltage of -8,000 V at a current of up to 100 mA is available.
The device is...
STS 717 - Statik Test System 717
- Testing of power semiconductors and power semiconductor modules
- All application areas of the individual devices
- Reverse current measurement
- Forward current measurement
- Leakage current...
KML 710 - Kennlinienmessgerät mit digitalem Sichtgerät
The KML 710 has been designed to test the blocking characteristics of power semiconductors. A peak voltage of up to 15 kV at a current of up to 200 mA is available.
The KML 710 offers manual control...
HTRB 689 - HTRB-Prüfstand
The test system HTRB 689 is used for determination of the robustness and long term stability of diodes and IGBT modules under high temperature reverse bias condition.
The minimum system consists of...
TSM 664 - Testsystem für statische Messungen an Leistungshalbleitern
The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.
The test system consists of up to 6 components and is fully variable...
SML 664 - Sperrmessgerät für Leistungshalbleiter
The measurement instrument SML 664 to investigate into the blocking characteristics of power semiconductors.
The device is designed for manual use as well as for integration in an automated...
MLH 634 - Messgerät für Leistungshalbleiter
The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.
It offers all static parameter tests in one instrument. For application in a pick...
BVM 625 - Sperrmessgerät
The instrument BVM 625 is used to investigate into the behavior of blocking voltage and reverse current of power semiconductors.
The blocking voltage measurement is implemented by increasing the...
TPS 625 - Testsystem für Leistungshalbleiter
The test system TPS 625 or 746 is used to test power semiconductors.
The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...
DT 616 - Diodentestgerät
The DT 616 tester is used for series measurement of diodes. It enables the testing of standard diodes, unipolar and bipolar Zener diodes:
1. Forward voltage VF
The voltage drop at the DUT...