STS 805 - Static Test System
The STS measurement system is used to test power semiconductors and power semiconductor modules.
There are 70 freely usable power and sense connections abailable, which enable software-controlled...
Statische Messsysteme
JT 777 - JEDEC Tester
The JT 777 is used to test diodes according to JEDEC Standard No. 282B.01. This describes the stress on diodes caused by alternating forward and reverse operation in the limit area of the...
DQA 775 - Durchlass- und Gateladung mit Avalanche Test
The DQA 775 is used to measure on-state voltages and gate charges, as well as to test the avalanche behavior of MOSFETs.
To determine the forward voltage, the test object is operated with the set...
TSM 738 - Statik Test System
The TSM 738 enables the measurement of the common characteristics of power semiconductors with only one DUT contacting.
The system consists of maximum six components and can be varied depending on...
TSM 664 - Testsystem für statische Messungen an Leistungshalbleitern
The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.
The test system consists of up to 6 components and is fully variable...
MLH 634 - Messgerät für Leistungshalbleiter
The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.
It offers all static parameter tests in one instrument. For application in a pick...
TPS 625 - Testsystem für Leistungshalbleiter
The test system TPS 625 or 746 is used to test power semiconductors.
The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...