The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 763 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The test system ZTH 749 is designed to measure the thermal resistance within power semiconductors devices.

The measurement of the temperature increase in a pn- junction is enabled by the relatively...

The TLW 739 has been designed to verify the life cycle characteristics of up to 18 power semiconductor devices (IGBT, MOSFET, Thyristor and diode).

Testing is implemented with forward load current...

The measuring instrument WM 694 realises the measurement of the thermal resistance of power semiconductors.

The measurement of the temperature increase in a pn- junction is enabled by the relatively...